Effects of Lightning Injection on Power-MOSFETs

##plugins.themes.bootstrap3.article.main##

##plugins.themes.bootstrap3.article.sidebar##

Published Mar 26, 2021
Jose Celaya Sankalita Saha Phil Wysocki Jay Ely Truong Nguyen George Szatkowski Sandra Koppen John Mielnik Roger Vaughan Kai Goebel

How to Cite

Celaya, J., Saha, S., Wysocki, P., Ely, J., Nguyen, T., Szatkowski, G., Koppen, S., Mielnik, J., Vaughan, R., & Goebel, K. (2021). Effects of Lightning Injection on Power-MOSFETs. Annual Conference of the PHM Society, 1(1). Retrieved from http://www.papers.phmsociety.org/index.php/phmconf/article/view/1507
Abstract 415 | PDF Downloads 129

##plugins.themes.bootstrap3.article.details##

Keywords

electronics PHM, field effect transistors (FET), materials degradation, semiconductor device reliability, applications: electronics

References
(Case and Miletta 1975) C. Case and J. Miletta. Capacitor Failure due to High Level Electrical Transients, Harry Diamond Laboratories, HDL-YM-75-25, 1975.
(Saha et al. 2009) B. Saha, J. Celaya, K. Goebel and P. Wysocki. Towards Prognostics for Electronics Components, in Proceedings of IEEE AEROSPACE, 2009.
(Satoh 2007) H. Satoh. Transient temperature response of avalanche diodes against lightning surges, Electronics and Communications in Japan (Part II: Electronics), vol. 72:(10), pp. 33-39, 2007.
(Satoh and Shimoda 1996) H. Satoh and Y. Shimoda. Two-dimensional analysis of surge response in thyristor lightning surge protection devices, in Proceedings of 8th International Symposium on Power Semiconductor Devices and ICs, 1996.
(Sonnenfeld et al. 2008) G. Sonnenfeld, K. Goebel and J. R. Celaya. An agile accelerated aging, characterization and scenario simulation system for gate controlled power transistors, in Proceedings of IEEE AUTOTESTCON, 2008.
(Tasca 1970) D. M. Tasca. Pulse Power Failure Modes in Semiconductors, IEEE Transactions on Nuclear Science, vol. 17:(6), 1970.
(Tasca 1976) D. M. Tasca. Pulse Power Damage Characteristics of Electrical Resistors, Air Force Weapons Laboratory, 1976.
(Wunsch and Bell 1968) D. C. Wunsch and R. R. Bell. Determination of Threshold Failure Levels of Semiconductor Diodes and Transistors Due to Pulse Voltages, IEEE Transactions on Nuclear Science, vol. 15:(6), pp. 244-259, 1968.
(Ely et. al. 2009) J. J. Ely, T. X. Nguyen, G. N. Szatkowski, S. V. Koppen, J. J. Mielnik, R. K. Vaughan, P. F. Wysocki, J. R. Celaya and S. Saha. Lightning Pin Injection Testing on MOSFETS, NASA, TM-2009-215794, 2009.
(Jenkins and Durgin 1975) C. R. Jenkins and D. L. Durgin. EMP Susceptibility of Integrated Circuits, in Proceedings of IEEE Conference on Nuclear and Space Radiation Effects, 1975.
(Jeong 2005) J.-S. Jeong. Stress Mechanism about Field Lightning Surge of High Voltage BJT Based Line Driver for ADSL System, Journal of Microelectronics Reliability, vol. 45, pp. 1398- 1401, 2005.
(Keefe and Perala 1999) R. L. Keefe and R. A. Perala. Lightning Protection for Modern Signal Systems, in Proceedings of AREMA Annual Conference, 1999.
(Lall et al. 2008) P. Lall, C. Bhat, M. Hande, V. More, R. Vaidya, J. Suhling, R. Pandher and K. Goebel. Latent Damage Assessent and Prognostication of Residual Life in Airborne Lead-Free Electronics Under Thermo- Mechanical Loads, in Proceedings of International Conference on Prognostics and Health Management, 2008.
(Plumer 2009) J. A. Plumer. System Functional Upset testing of Aircraft Electrical and Avionic Systems: How to Approach the Planning and Conduct of the Tests, Lightning Technologies, Inc., http://www.lightningtech.com/pdfs/icolse.pdf, last access on September 2009.
(RTCA/DO-160E 2004) RTCA/DO-160E. Environmental Conditions and Test Procedures for Airborne Equipment, Section 22 “Lightning Induced Transient Susceptibility”, RTCA, DO-160E, 2004.
(SAE 2005) SAE. Aircraft Lightning Environment and Related Test Waveforms, SAE, ARP5412, 2005.
Section
Technical Research Papers

Most read articles by the same author(s)

1 2 3 4 5 > >>